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New quantitative trait loci in wheat for flag leaf resistance to Stagonospora nodorum blotch

Francki, M.G., Shankar, M., Walker, E., Loughman, R., Golzar, H. and Ohm, H. (2011) New quantitative trait loci in wheat for flag leaf resistance to Stagonospora nodorum blotch. Phytopathology, 101 (11). pp. 1278-1284.

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Stagonospora nodorum blotch (SNB) is a significant disease in some wheat-growing regions of the world. Resistance in wheat to Stagonospora nodorum is complex, whereby genes for seedling, flag leaf, and glume resistance are independent. The aims of this study were to identify alternative genes for flag leaf resistance, to compare and contrast with known quantitative trait loci (QTL) for SNB resistance, and to determine the potential role of host-specific toxins for SNB QTL. Novel QTL for flag leaf resistance were identified on chromosome 2AS inherited from winter wheat parent 'P92201D5' and chromosome IBS from spring wheat parent 'EGA Blanco'. The chromosomal map position of markers associated with QTL on IBS and 2AS indicated that they were unlikely to be associated with known host toxin insensitivity loci. A QTL on chromosome 5BL inherited from EGA Blanco had highly significant association with markers fcp001 and fcp620 based on disease evaluation in 2007 and, therefore, is likely to be associated with Tsnl-ToxA insensitivity for flag leaf resistance. However, fcp001 and fcp620 were not associated with a QTL detected based on disease evaluation in 2008, indicating two linked QTL for flag leaf resistance with multiple genes residing on 5BL. This study identified novel QTL and their effects in controlling flag leaf SNB resistance

Item Type: Journal Article
Publisher: The American Phytopathological Society
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