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Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS)

Jiang, Z-T, Thurgate, S. and Wilkie, P. (2001) Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS). Surface and Interface Analysis, 31 (4). pp. 287-290.

Link to Published Version: http://dx.doi.org/10.1002/sia.990
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Abstract

In this study, we present Cu L3M45M45 Auger spectra in coincidence with Cu 2p3/2 from the oxidized surface of Cu (i.e. CuOx/Cu) and Cu 2p3/2 lines in coincidence with Auger 1G and 3F terms of Cu L3VV from Cu. Comparison of the L3VV line structures of CuOx/Cu with that of Cu reveals that the Auger line has changed to band-like in the CuOx/Cu material. The reduced mean free path of the Auger electron in coincidence with the photoelectron displays the Auger line of the CuOx surface. The asymmetric broadening of the Cu 2p3/2 lines in coincidence with 1G and 3F terms from Cu illustrates that a single-step model is essential for describing the Auger lineshape of copper.

Item Type: Journal Article
Murdoch Affiliation(s): School of Engineering and Energy
Publisher: John Wiley and Sons
Copyright: 2001 John Wiley & Sons, Ltd
URI: http://researchrepository.murdoch.edu.au/id/eprint/5218
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