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Limits to Auger-electron core-loss electron coincidence spectroscopy

Stelbovics, A.T., Todd, B.D., Thurgate, S.M. and Lohmann, B. (1992) Limits to Auger-electron core-loss electron coincidence spectroscopy. Surface Science, 278 (1-2). pp. 193-201.

Link to Published Version: http://dx.doi.org/10.1016/0039-6028(92)90595-W
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Abstract

Successful X-ray excited Auger coincidence experiments from solid surfaces have been performed in the past few years. We model the count rate and signal-to-background ratio for an electron-excited Auger coincidence experiment on a silicon surface in reflection mode geometry. The dominant process leading to coincidences are shown to be of second order. A typical experiment is considered, with experimental parameters being used where required. We conclude that while such an experiment is technically feasible, the X-ray excited coincidence Auger experiments are to be preferred.

Item Type: Journal Article
Murdoch Affiliation: Centre for Atomic, Molecular and Surface Physics
Publisher: Elsevier BV
URI: http://researchrepository.murdoch.edu.au/id/eprint/35780
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