Limits to Auger-electron core-loss electron coincidence spectroscopy

Stelbovics, A.T., Todd, B.D., Thurgate, S.M. and Lohmann, B. (1992) Limits to Auger-electron core-loss electron coincidence spectroscopy. Surface Science, 278 (1-2). pp. 193-201.

Abstract

Successful X-ray excited Auger coincidence experiments from solid surfaces have been performed in the past few years. We model the count rate and signal-to-background ratio for an electron-excited Auger coincidence experiment on a silicon surface in reflection mode geometry. The dominant process leading to coincidences are shown to be of second order. A typical experiment is considered, with experimental parameters being used where required. We conclude that while such an experiment is technically feasible, the X-ray excited coincidence Auger experiments are to be preferred.

Item Type:	Journal Article
Murdoch Affiliation(s):	Centre for Atomic, Molecular and Surface Physics
Publisher:	Elsevier BV
URI:	http://researchrepository.murdoch.edu.au/id/eprint/35780

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