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An electron spectrometer for LEED fine structure measurements

Thurgate, S. and Hitchen, G. (1985) An electron spectrometer for LEED fine structure measurements. Applied Surface Science, 24 (2). pp. 202-212.

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LEED fine structure analysis requires intensity versus energy data for very low energy electrons (typically 5–25 eV) at various angles of incidence and azimuth. An electron spectrometer capable of fulfilling these requirements was built and used to obtain data for Cu(111). This spectrometer differs from others used for these type of measurements in that it used a retarding field analyzer to collect the elastically scattered beams instead of a deflecting analyzer. This considerably simplifies the apparatus required and the experimental procedure as the collector can be used at a fixed angle to collect data from a number of different angles of incidence. The experimental design is discussed and sample results, showing that three peaks were resolved, are presented.

Item Type: Journal Article
Murdoch Affiliation(s): School of Mathematical and Physical Sciences
Publisher: Elsevier BV
Copyright: © 1985 Published by Elsevier B.V.
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