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Nanotechnology strength indicators: international rankings based on US patents

Marinova, D. and McAleer, M. (2002) Nanotechnology strength indicators: international rankings based on US patents. Nanotechnology, Science and Applications, 14 (1). R1-R7.

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Technological strength indicators (TSIs) based on patent statistics for 1975-2000 are used to analyse patenting of nanotechnology in the USA, and to compile international rankings for the top 12 foreign patenting countries (namely Australia, Canada, France, Germany, Great Britain, Italy, Japan, Korea, the Netherlands, Sweden, Switzerland and Taiwan). As the indicators are not directly observable, various proxy variables are used, namely the technological specialization index for national priorities, patent shares for international presence, citation rate for the contribution of patents to knowledge development and rate of assigned patents for potential commercial benefits. The best performing country is France, followed by Japan and Canada. It is shown that expertise and strength in nanotechnology are not evenly distributed among the technologically advanced countries, with the TSIs revealing different emphases in the development of nanotechnology.

Item Type: Journal Article
Murdoch Affiliation(s): Institute for Sustainability and Technology Policy
Publisher: Dove Medical Press Limited
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