Low energy electron diffraction
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Jennings, P.J. (2003) Low energy electron diffraction. In: O'Connor, D.J., Sexton, B.A. and Smart, R.C., (eds.) Surface analysis methods in materials science. Springer, Berlin, Germany, pp. 275-289.
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Abstract
One of the most powerful techniques available for surface structural analysis is low energy electron diffraction (LEED). It is widely used in materials science research to study surface structure and bonding and the effects of structure on surface processes. However because it requires single crystals and ultrahigh vacuum conditions it has limited value for applied surface analysis, which is often concerned with polycrystalline or amorphous materials. LEED has many similarities to X-ray and neutron diffraction but it is preferred for surface studies because of the short mean free path of low energy electrons in solids.
| Item Type: | Book Chapter |
|---|---|
| Murdoch Affiliation: | School of Mathematical and Physical Sciences |
| Publisher: | Springer |
| URI: | http://researchrepository.murdoch.edu.au/id/eprint/25071 |
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