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Determination of the surface-potential barrier of Cu(001) from low-energy-electron-diffraction fine structure

Hitchen, G.J., Thurgate, S.M. and Jennings, P.J. (1991) Determination of the surface-potential barrier of Cu(001) from low-energy-electron-diffraction fine structure. Physical Review B, 44 (8). pp. 3939-3942.

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Link to Published Version: http://dx.doi.org/10.1103/PhysRevB.44.3939
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Abstract

The surface-potential barrier shape for the (001) face of copper was determined by an analysis of low-energy-electron-diffraction fine-structure measurements. The fitting of the fine-structure spectra was performed with a precise knowledge of the incident diffraction conditions of the experimental data (incidence angle, azimuthal angle, and contact-potential difference). This precision is necessary to allow a consistent barrier shape to be determined. For three different angles of incidence, it was found that a good match between theoretical and experimental I-V spectra was obtained when the image plane was located 2.5 a.u. from the topmost layer of atoms.

Item Type: Journal Article
Murdoch Affiliation: School of Mathematical and Physical Sciences
Publisher: American Physical Society
Copyright: © 1991 The American Physical Society.
URI: http://researchrepository.murdoch.edu.au/id/eprint/20066
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