XPS valence band spectroscopy as an analytical tool - a study of hydrogenated amorphous silicon
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Lund, C.P., Klauber, C., Walker, E.
ORCID: 0000-0003-2762-2961, Jennings, P.J., Clare, B.W., Cornish, J.C.L. and Hefter, G.T.
(1995)
XPS valence band spectroscopy as an analytical tool - a study of hydrogenated amorphous silicon.
In: Australasia-Asia XPS Symposium, 14 - 17 November, Sydney, Australia
| Item Type: | Conference Paper |
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| Murdoch Affiliation: | School of Mathematical and Physical Sciences |
| URI: | http://researchrepository.murdoch.edu.au/id/eprint/19781 |
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