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XPS valence band spectroscopy as an analytical tool - a study of hydrogenated amorphous silicon

Lund, C.P., Klauber, C., Walker, E.ORCID: 0000-0003-2762-2961, Jennings, P.J., Clare, B.W., Cornish, J.C.L. and Hefter, G.T. (1995) XPS valence band spectroscopy as an analytical tool - a study of hydrogenated amorphous silicon. In: Australasia-Asia XPS Symposium, 14 - 17 November, Sydney, Australia

Item Type: Conference Paper
Murdoch Affiliation: School of Mathematical and Physical Sciences
URI: http://researchrepository.murdoch.edu.au/id/eprint/19781
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