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Publications: Walker, Elaine

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Number of items: 6.

Journal Article

Walker, E., Lund, C.P., Jennings, P., Cornish, J.C.L., Klauber, C. and Hefter, G. (2004) Noble gas ion effects on the XPS valence band spectra of silicon. Applied Surface Science, 222 (1-4). pp. 13-16.

Walker, E., Lund, C.P., Klauber, C., Jennings, P.J., Cornish, J.C.L., Clare, B.W. and Hefter, G. (1998) A semi-quantitative study of disorder in argon ion-bombarded crystalline silicon using Auger lineshape analysis. Applied Surface Science, 126 (3-4). pp. 265-272.

Conference Paper

Walker, E., Lund, C.P., Klauber, C., Cornish, J.C.L., Jennings, P.J. and Hefter, G. (1997) Noble gas core level interference in photoelectron spectroscopy of the valence band of ion bombarded silicon. In: 4th Congress of the Vacuum Society of Australia, November, Canberra

Walker, E., Lund, C.P., Klauber, C., Cornish, J.C.L., Jennings, P.J., Clare, B.W. and Hefter, G. (1997) Studies of the structure of amorphous silicon solar cell materials and devices using surface analysis techniques. In: 35th ANZSES Conference, 1 - 3 December, Canberra, Australia

Lund, C.P., Walker, E., Klauber, C., Jennings, P.J., Cornish, J.C.L., Clare, B.W. and Hefter, G.T. (1995) A Semi-quantitative study of disorder in ion-bombarded crystalline silicon using Auger lineshape analysis. In: 9th AINSE Conference on Nuclear Techniques of Analysis and 3rd Vacuum Society of Australia Congress NTA/VSA'95, 27 - 29 November, Newcastle, NSW, Australia

Lund, C.P., Klauber, C., Walker, E., Jennings, P.J., Clare, B.W., Cornish, J.C.L. and Hefter, G.T. (1995) XPS valence band spectroscopy as an analytical tool - a study of hydrogenated amorphous silicon. In: Australasia-Asia XPS Symposium, 14 - 17 November, Sydney, Australia

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