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Publications: Talukder, Gani

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Number of items: 6.

1997

Talukder, G., Sobhan, M.A., Hashem, A., Talukder, M.R., Cornish, J.C.L., Jennings, P., Hefter, G.T. and Clare, B.W. (1997) Infrared study of as-deposited sputtered hydrogenated amorphous silicon films. Indian Journal of Pure and Applied, 35 (9). pp. 568-573.

Talukder, G., Sobhan, M.A., Hashem, A., Talukder, M.R., Cornish, J.C.L., Jennings, P., Hefter, G.T. and Clare, B.W. (1997) Infrared study of sputtered hydrogenated amorphous silicon films with unintentionally incorporated oxygen and nitrogen. Indian Journal of Pure and Applied Physics, 35 (9). pp. 574-578.

1994

Clare, B.W., Talukder, G., Jennings, P.J., Cornish, J.C.L. and Hefter, G.T. (1994) Effect of charge on bond strength in hydrogenated amorphous silicon. Journal of Computational Chemistry, 15 (6). pp. 644-652.

1993

Talukder, G., Cornish, J.C.L., Jennings, P. and Hefter, G.T. (1993) Annealing effects on hydrogen, oxygen and nitrogen bonding in sputtered a-Si network. Thin Solid Films, 223 (1). pp. 167-172.

Clare, B.W., Jennings, P.J., Cornish, J.C.L., Talukder, G., Lund, C.P. and Hefter, G.T. (1993) Simulation of the electronic and vibrational structure of hydrogenated amorphous silicon using cluster models. Journal of Computational Chemistry, 14 (12). pp. 1423-1428.

1992

Talukder, G., Cornish, J.C.L., Jennings, P., Hefter, G.T., Clare, B.W. and Livingstone, J. (1992) Effects of annealing on infrared and thermal‐effusion spectra of sputtered a‐Si:H alloys. Journal of Applied Physics, 71 (1). pp. 403-409.

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