Heritability of resistance to brown spot and root rot of narrow-leafed lupins caused by Pleiochaeta setosa (Kirchn.) Hughes in field experiments
Cowling, W.A., Sweetingham, M.W., Diepeveen, D. and Cullis, B.R. (1997) Heritability of resistance to brown spot and root rot of narrow-leafed lupins caused by Pleiochaeta setosa (Kirchn.) Hughes in field experiments. Plant Breeding, 116 (4). pp. 341-345.
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Resistance to brown spot (BS) and Pleiochaeta root rot (PRR) in narrow-leafed lupin (Lupinus angustifolius L.) was assessed on a broad range of breeding lines and cultivars in field trials in Western Australia in 1985 and 1986. Both diseases are caused by Pleiochaeta setosa (Kirchn.) Hughes. Lines were grown in 5m × 1m plots in randomized complete block experiments with various disease pressures associated with cropping history — first, second and third successive lupin crops after cereals at one site in 1985, and first and second lupin crops at two sites in 1986. Best linear unbiased predictors (BLUPs) of defoliation caused by BS across experiments ranged from 64% to 123% of ‘Gungurru’, and BLUPs for PRR lesion severity ranged from 82% to 118% of ‘Gungurru’. For both diseases, genotypic variance was several times greater than genotype × environment variance, but error variance was relatively low for BS and high for PRR. Consequently, broad sense heritability (h2) for BS resistance was high in the seven experiments (range 0.89–0.94) but low for PRR resistance (range 0.00–0.53). There was a moderate correlation between BLUPs for resistance to BS and PRR across experiments (r = 0.36, P < 0.05). Genotypic correlations between resistance to BS and PRR were estimated at 0.57 ± 0.20 and 0.75 ± 0.31 in two experiments in 1985. Breeding progress is likely to be high for BS resistance and there may be slight improvements in PRR resistance associated with BS resistance. However, this field technique is not suitable for rapid breeding progress for PRR resistance.
|Publication Type:||Journal Article|
|Publisher:||Blackwell Publishing Inc.|
|Copyright:||1997 Blackwell Wissenschafts-Verlag|
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