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Optical properties of Al-Cr oxide films by spectroscopic ellipsometry

Jiang, Z-T, Fujita, Y., Aoyama, M. and Yamaguchi, T. (1998) Optical properties of Al-Cr oxide films by spectroscopic ellipsometry. In: The Japan Society of Applied Physics (The 45th Spring Meeting), 28 - 30 March, Tokyo, Japan.

Publication Type: Conference Item
URI: http://researchrepository.murdoch.edu.au/id/eprint/5538
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