Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS)
Jiang, Z-T, Thurgate, S. and Wilkie, P. (2001) Line structure in photoelectron and Auger electron spectra of CuOx/Cu and Cu by Auger photoelectron coincidence spectroscopy (APECS). Surface and Interface Analysis, 31 (4). pp. 287-290.
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In this study, we present Cu L3M45M45 Auger spectra in coincidence with Cu 2p3/2 from the oxidized surface of Cu (i.e. CuOx/Cu) and Cu 2p3/2 lines in coincidence with Auger 1G and 3F terms of Cu L3VV from Cu. Comparison of the L3VV line structures of CuOx/Cu with that of Cu reveals that the Auger line has changed to band-like in the CuOx/Cu material. The reduced mean free path of the Auger electron in coincidence with the photoelectron displays the Auger line of the CuOx surface. The asymmetric broadening of the Cu 2p3/2 lines in coincidence with 1G and 3F terms from Cu illustrates that a single-step model is essential for describing the Auger lineshape of copper.
|Publication Type:||Journal Article|
|Murdoch Affiliation:||School of Engineering and Energy|
|Publisher:||John Wiley and Sons|
|Copyright:||2001 John Wiley & Sons, Ltd|
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