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Techniques for very low energy electron diffraction

Price, G.L. (1980) Techniques for very low energy electron diffraction. Review of Scientific Instruments, 51 (5). pp. 605-609.

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    Link to Published Version: http://dx.doi.org/10.1063/1.1136262
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    Abstract

    LEED intensity curves between 0–50 eV contain sharp peaks due to electronic surface resonances. Successful comparison with theory requires an accurate knowledge of the incidence angles and energy resolution ≲0.15 eV. It is shown that these requirements can be achieved with a conventional LEED system. The resolution was obtained by doubly modulating the four grid retarding optics and the electron gun. The incidence angles were found with a simple photographic technique.

    Publication Type: Journal Article
    Publisher: American Institute of Physics
    Copyright: © 1980 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
    URI: http://researchrepository.murdoch.edu.au/id/eprint/5112
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